DE SOUZA, Roger A.; MARTIN, Manfred. Secondary ion mass spectrometry and its application to diffusion in oxides. Diffusion Fundamentals, [S. l.], v. 12, 2010. DOI: 10.62721/diffusion-fundamentals.12.363. Disponível em: https://diffusion.publia.org/diffusion/article/view/363. Acesso em: 5 jun. 2025.