RAJ, Arindam; ADERIBIGBE, Michael; SCHROERS, Jan. High Resolution Mapping of Diffusion Characteristics in General Microstructures. Diffusion Fundamentals, [S. l.], v. 39, 2025. DOI: 10.62721/diffusion-fundamentals.39.1264. Disponível em: https://diffusion.publia.org/diffusion/article/view/1264. Acesso em: 30 nov. 2025.