Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18O-tracer investigations on interface diffusion in Y2O3/YSZ multilayer systems

Sven Ole Steinmüller; Halit Aydin; Alexander Rein; Carsten Korte

doi:10.62721/diffusion-fundamentals.12.383

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18O-tracer investigations on interface diffusion in Y2O3/YSZ multilayer systems

Authors

Sven Ole Steinmüller
Halit Aydin
Alexander Rein
Carsten Korte

DOI:

https://doi.org/10.62721/diffusion-fundamentals.12.383

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Published

2010-06-01

How to Cite

[1]

S. O. Steinmüller, H. Aydin, A. Rein, and C. Korte, “Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18O-tracer investigations on interface diffusion in Y2O3/YSZ multilayer systems”, diffus. fundam., vol. 12, Jun. 2010, doi: 10.62721/diffusion-fundamentals.12.383.

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Issue

Vol. 12 (2010): Special Issue "Spectroscopic Methods in Solid State Diffusion and Reactions

Section

Extended Abstracts

URN

http://nbn-resolving.org/urn:nbn:de:bsz:15-qucosa-186982