In situ examination of Lanthanum Strontium Manganate (LSM) with Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

Authors

  • Anne-Katrin Huber
  • Sven Ole Steinmüller
  • Eva Mutoro
  • Bjoern Luerßen
  • Jürgen Janek

DOI:

https://doi.org/10.62721/diffusion-fundamentals.12.381

Downloads

Published

2010-06-01

How to Cite

[1]
A.-K. Huber, S. O. Steinmüller, E. Mutoro, B. Luerßen, and J. Janek, “In situ examination of Lanthanum Strontium Manganate (LSM) with Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)”, diffus. fundam., vol. 12, Jun. 2010, doi: 10.62721/diffusion-fundamentals.12.381.

Issue

Vol. 12 (2010): Special Issue "Spectroscopic Methods in Solid State Diffusion and Reactions

Section

Extended Abstracts

URN

http://nbn-resolving.org/urn:nbn:de:bsz:15-qucosa-186860