Neutron Reflectometry – a tool to study self-diffusion on the (Sub)Nanometer scale in metastable materials

Harald Schmidt; Erwin Hüger; Thomas Geue; Jochen Stahn; Ursula Tietze; Dieter Lott

doi:10.62721/diffusion-fundamentals.12.365

Neutron Reflectometry – a tool to study self-diffusion on the (Sub)Nanometer scale in metastable materials

Authors

Harald Schmidt
Erwin Hüger
Thomas Geue
Jochen Stahn
Ursula Tietze
Dieter Lott

DOI:

https://doi.org/10.62721/diffusion-fundamentals.12.365

Downloads

Published

2010-06-01

How to Cite

[1]

H. Schmidt, E. Hüger, T. Geue, J. Stahn, U. Tietze, and D. Lott, “Neutron Reflectometry – a tool to study self-diffusion on the (Sub)Nanometer scale in metastable materials”, diffus. fundam., vol. 12, Jun. 2010, doi: 10.62721/diffusion-fundamentals.12.365.

ACM
ACS
APA
ABNT
Chicago
Harvard
IEEE
MLA
Turabian
Vancouver

Download Citation

Endnote/Zotero/Mendeley (RIS)
BibTeX

Issue

Vol. 12 (2010): Special Issue "Spectroscopic Methods in Solid State Diffusion and Reactions

Section

Extended Abstracts

URN

http://nbn-resolving.org/urn:nbn:de:bsz:15-qucosa-186599