Secondary ion mass spectrometry and its application to diffusion in oxides

Authors

  • Roger A. De Souza
  • Manfred Martin

DOI:

https://doi.org/10.62721/diffusion-fundamentals.12.363

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Published

2010-06-01

How to Cite

[1]
R. A. De Souza and M. Martin, “Secondary ion mass spectrometry and its application to diffusion in oxides”, diffus. fundam., vol. 12, Jun. 2010, doi: 10.62721/diffusion-fundamentals.12.363.

Issue

Vol. 12 (2010): Special Issue "Spectroscopic Methods in Solid State Diffusion and Reactions

Section

Extended Abstracts

URN

http://nbn-resolving.org/urn:nbn:de:bsz:15-qucosa-186567