High Resolution Mapping of Diffusion Characteristics in General Microstructures

Authors

  • Arindam Raj Northwestern University, Evanston, USA
  • Michael Aderibigbe Yale University, New Haven, USA
  • Jan Schroers Yale University, New Haven, USA

DOI:

https://doi.org/10.62721/diffusion-fundamentals.39.1264

Keywords:

Diffusion

References

[1] A. Raj, Y. J. Xie, S. Sohn, M. Aderibigbe, N. J. Liu, G. N. Liu, P. Hosemann and J. Schroers, Direct determination of diffusion flux in alloys via spatial separation of flux. Acta Mater 284 (2025) id.120615.

[2] A. Raj, M. Aderibigbe, E. Lund, Y-X.Yang, S. Sohn, and J. Schroers, Local Deformation Mapping Reveals Diffusion through Microstructures. (2025).

[3] A. Raj, N. J. Liu, G. N. Liu, S. Sohn, J. X. Xiang, Z. Liu and J. Schroers. Nanomolding of Gold and Gold-Silicon Heterostructures at Room Temperature. Acs Nano 15 (2021) 14275-14284.

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Published

2025-11-03

How to Cite

[1]
A. Raj, M. Aderibigbe, and J. Schroers, “High Resolution Mapping of Diffusion Characteristics in General Microstructures”, diffus. fundam., vol. 39, Nov. 2025, doi: 10.62721/diffusion-fundamentals.39.1264.

Issue

Vol. 39 (2025): Special Issue Diffusion Fundamentals XI

Section

Extended Abstracts

License

Copyright (c) 2025 Arindam Raj, Michael Aderibigbe, Jan Schroers

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.